Test Service
KYEC provides a wide range of test platforms for wafer probe / testing solutions. The probing temperature ranges from -55 ° C to 150 ° C with capability of handling 5, 6, 8 & 12" wafers. The production is classified to class 100 for CIS/CCD products and class 1k for other products.
Other services available:
- Laser Repair
- Wafer Level Burn In
- Wafer Level Cycling
Probe Card In-house Maintenance:
- Cantilever, Vertical or MEMS Probe Cards
- High Parallelism Probe Cards up to 256 DUT
- High Pin Count Probe Cards over 20,000 probes
- Fine Pitch Probe Card: min pitch 49um
- Probe Card Analyzer: PRVX3/4, PB6500
