KYEC My Fab
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Memory Consumer Electronics Logic & Mixed Signal LCD Driver CMOS Image Sensor Radio Frequency System on Chip Micro-electro mechanical Systems Bio Chip Technology Support

Test Solutions Provider

KYEC can provide complete test solutions to reduce time of customers on product design, volume production, time to market and test cycle.

KYEC's flexibility in testing satisfies the needs of new product introduction and mass production that includes:

1. Test Program Development & Product Characterization

KYEC test development and technology service team offers Innovative research and test Engineering skills second to none in the testing industry.

KYEC's unique capability regarding the initial design of the product enables customers to benefit time-to-market and cost effective solutions.

The range of services available includes:

  1. Test spec verification
  2. Test program development
  3. Analysis of product characterization
  4. Product / Test Correlation
  5. Program release

The above services are available for the entire test applications below:

  1. Memory
  2. Logic, digital and mixed signal
  3. CMOS Image Sensor (CIS) /Charge-coupled Device (CCD)
  4. Radio Frequency (RF)
  5. Liquid Crystal Display (LCD) driver
  6. Micro-electromechanical Systems (MEMS)

2. Test Platform Conversion

KYEC's test platform can accept different test formats such as Verilog HDL, WGL, and STIL. Through the tools developed by KYEC and the expertise of test technology, we are able to convert various test modes into selected test platforms. Our services include:

  1. Fault simulation
  2. Test pattern synthesis
  3. Test mode conversion to selected test platform

3. Test Hardware Design & Fabrication

We provide complete and customized design solutions for probe card, load board and other accessories per customers' requirements. KYEC's services include:

  1. Mechanical and electrical design layout
  2. Probe card design and fabrication
  3. Load board design and fabrication
  4. Socket design and fabrication
  5. Change-over kit design and fabrication

KYEC also have full control over accessories by planned maintenance program on all serviceable parts.

4. Test Data Management

KYEC can build customized data feedback system to automatically transfer data to customer. These data are kept securely for a minimum of 3 years or longer based on customers' requests. KYEC IT Team provides the following key services:

  1. Remote access
    Allowing customers to log into testers work station to perform debug, repair and upload functions.
  2. Automated File Transfer Protocol (FTP) and Virtual Factory (e-Fab)
    Test data is transmitted periodically via FTP format. Customers can also log in using the specified username and password and directly access the e-Fab server of KYEC to download test data.

5. Test Data and Yield Analysis

KYEC deploy 3 methods to monitor the testing process

  1. Conventional run-card
    Check all items according to customer yield criteria and record data manually on run-card.
  2. On-Line Monitoring System (OMS)
    Automatically monitor test yield, special bin control (SBC) and test data imbalance. Alerting operators after problems are found and follow the steps to troubleshoot.
  3. Test data management system
    KYEC's main test data management system provides yield monitoring, data transfer and all other requirements based on customer specifications.

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