KYEC My Fab
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Memory Consumer Electronics Logic & Mixed Signal LCD Driver CMOS Image Sensor Radio Frequency System on Chip Micro-electro mechanical Systems Bio Chip Technology Support

KYEC has the capability to provide the complete range of testing, diagnosis, verification, characterization and debugging services for complex SOC devices such as ASIC and ASSP. Our highly efficient testing processes are performed block by block to ensure 100% electrical testing. We have the capability of specifying the test speed, fault definition, diagnostic options and test time to ensure that all operating conditions are reproduced and all faults exposed and fully debugged.

A complete range of test platforms are available to support a full range of SOC test requirements.

Vendor

Model

Speed

Advantest

V93000

200 Mbps ~ 16 Gbps

T2000

500/800/1600 Mbps

LTX-Credence

Quartet

200 MHz

D10/DiamondX

200 Mbps

ITS3000 EXA

200 MHz

Sapphire

400 MHz

Teradyne

Catalyst

200 MHz

Integra Flex

200 MHz

Ultra Flex

800/1000/1600 Mbps

J750/J750EX

100 MHz /200 MHz

 

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