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Memory Consumer Electronics Logic & Mixed Signal LCD Driver CMOS Image Sensor Radio Frequency System on Chip Micro-electro mechanical Systems Bio Chip Technology Support

KYEC has developed very cost-effective services for MEMS ICs by using its self-built high parallel testing solutions. It provides customers with various test solutions to test many different kinds of multi-mode MEMS devices. So far KYEC has succeeded in testing related MEMS devices such as Microphone, gyroscope, acceleration sensor, electronic compass, pressure sensor and will provide cost-effective and high throughput multi-mode testing solutions for 9DOF (Degree of Freedom, DOF), 10 DOF functionalities and Humidity/CO2 sensor in the near future.

A complete range of test platforms are available to support a full range of MEMS test requirements.

Vendor

Model

Speed (MHz)

KYEC in-house designed testing platform E320 100 MHz/200 MHz
SPEA DOT100RM 50 MHz

KYEC's MEMS test service solution for IMU sensors is as follows

IMU Test System

 

 

 

 

Handler

SPEA/H3580

SPEA/3560

HT200M

KYEC/RD Design

Tester

DOTI00

DOTI00

E320

E320

Max Multi-sites

49 sites

32 sites

36 sites

80 sites

Handling

Input

JEDEC Tray

Bowl feeder (option)

Bowl feeder

Bowl feeder/Waffle Tray

Output

JEDEC Tray

T&R (RSU200)

T&R (All in one)

T&R (All in one)

Minimum package

2x2 mm

2x2 mm

~1x1 mm

~1x1 mm

Vision lnspection

No

No

5 sides (option)

5 sides (option)

Motion Stimulus

RTA 366

RTA 330

HT Gyro module

KYE G1

Range:
Angle / Angular speed

450° / ±400 deg/s

-90° ~ 450° / ±500 deg /s

-180° ~ +180° / ±200 deg/s

-90° ~ 450° / ±500 deg/s

Accuracy:
Rotation angle / Angular speed

±0.01° / ± 0.05% of full speed

±0.01° / ± 0.05% of full speed

±0.05 / ± 0.3% deg/sec

±0.01° / ± 0.1% of full speed

Temperature range

-40° ~ 150°

Room

Room

Room

Capacity status

Ready

Ready in production

Need to upgrade Gyro module

Ready in production

KYEC's MEMS pressure sensor / barometer test solution

Pressure / Barometer

 

 

 

 

Handler

SPEA / H3580

KYEC / P_Series

KYEC / PT_Series

KYEC / PT++_Series

Tester

DOT100

E320

E320

E320ED

Max. Multi-sites test in parallelism

49 sites

64 sites x 4 = 256 sites

128 sites x 4 = 512 sites

256 sites x 4 = 1024 sites

Handling

Input

JEDEC Tray

Waffle Tray

Waffle Tray

Waffle Tray

Output

JEDEC Tray

T&R (All in one)

T&R (All in one)

TBD

Minimum package

~2x2mm

~1x1mm

~1x1mm

~1x1mm

Vision Inspection

No

5 sides (option)

5 sides (option)

5 sides (option)

Tester resource

DOT100 / 16 slots

E320 / 23x2 slots

E320 / 23x4slots

E320ED /26x4 slots

PE card I/O channel

768 channels

1792 channels

3584 channels

7168 channels

DPS (Direct power Supply)

384 channels

288 channels

576 channels

1152 channels

Stimulus for Pressure

TPSU

K_CHV1

K_CHV2

K_CHV3

Working Range

Pressure/Temperature

30 ~ 400 kPa /

-40 ~ 150℃

30 ~ 150 kPa /

10 ~ 90℃

10 ~ 130 kPa /

-20 ~ 90℃

30 ~ 200 kPa /

-10 ~ 90℃

Sensor Accuracy

Pressure/Temperature

0.005% of Full scale / ± 0.1℃

0.01% of Full scale / ± 0.1℃

0.005% of Full scale / ± 0.1℃

0.01% of Full scale / ± 0.1℃

Max. Chamber number

3 chambers

(Test ping pang by each chamber)

4 chambers

+ 4 pre-heat chambers

4 chambers

(Test in parallelism for all chambers)

4 chambers

(Test in parallelism for all chamber)

Status

Ready for Production

Ready in Production

Ready in Production

To be ready in Q3/2019

KYEC factory of Electronic Micro-Electro-Mechanical System (MEMS) Product

KYEC Taiwan Tongluo Factory started production in the second quarter of 2014

 
 
 
 
 
 

KYEC's dedicated MEMS test platform

  • KYEC builds the Tongluo factory in 2014 and reserves a basement for testing MEMS sensors.
  • We have done a lot of work to prepare the test environment for sensor testing.
  • Test capacity is growing rapidly.
 
 

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