KYEC My Fab
EN
Wafer Probing Final Test Burn-in System Level Testing (SLT) Back end service

King Yuan Electronics (KYEC) possesses extensive experience in System Level Testing (SLT) for products such as AI chips (including AI GPUs, AI ASICs, and AI CPUs) and mobile chips. The company's SLT testing expertise spans a wide trajectory, ranging from legacy devices like network routers, DVD players, and Northbridge/Southbridge chipsets, to contemporary networking and automotive applications.

In response to the evolving trends of electronic products, KYEC continuously upgrades the performance of its test equipment. These enhancements are designed to accommodate varying IC package dimensions and stringent test temperature requirements, ensuring comprehensive readiness for future testing demands.

Spec for KYEC SLT testing machines: 

機    型

WS-3000

HT-3060

HT-3012

HT-3012CX

HT-3015CT

ASFT3200

Titan

ATS7038

Site number

6 6 6 or 12

6

6

16 or 24

424

720

Testing size

(Socket in the center /mm)

350*350

395*400 

550*550      (6 sites)
290*450    (12 sites)

570*590

570*580

410*910  (16 sites)
410*710 (24 sites) 

88*115

630*610

Interface

RS232, TTL

RS232, TTL

RS232, TTL

RS232, TTL

RS232, TTL

RS232, TTL

RS232

RS232

Temperature

25℃~125℃

25℃~125℃

25℃~125℃

-55℃~130℃

-55℃~130℃

25℃~125℃

Ambient

Ambient

Contact Force

20~60 Kg

20~60 Kg

20~100 Kg

30~200 Kg

30~300 Kg

~450 Kg

 

 

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