KYEC My Fab
EN
Equipment Development Development of spare parts and test program Automation Control Vertical Probe Card (VCPC)

The testing machine designed and manufactured by KYEC is one of the most cost-effective test platforms and solutions on the market. Advantages include

  • Cost effective, high throughput and high efficiency test solution
  • Open architecture, easy to expand and maintain
  • Architecture of 200MHz or above
  • Easy for test program development
  • Occupy small space: L820 x W660 x H400

KYEC in-house designed testers offer unique and differentiated professional testing outsourcing services for the global semiconductor industry, thereby reducing total testing expenses substantially. Hence, the products of our clients can be launched immediately and at competitive costs. 

The KYEC in-house designed test platform fully integrates machine performance, mechanism interfaces and system programs. In addition to its technological advantage, the design features a full integration of production technologies of key parts (e.g., machinery and equipment spare parts) and the development and innovation of software and hardware interfaces. This integration can enhance production efficiency and output effectively. This is a comprehensive test solution that yields compatibility (flexibility) and expansibility (customization). 

Initially the KYEC in-house designed test platform provided product testing services for chips of mixed-signal, power management IC and RF. These services were based on logic and analog test modules designed specifically for the platform. Currently, the platform has been expanded, featuring high-speed test module mechanisms (e.g., MEMS-G/P sensor and CMOS module) and the design and development of key technologies and parts (e.g., technologies for developing and manufacturing strip handlers, and the design and development of VCPC high-frequency test boards). In the future, KYEC research teams will develop comprehensive logic IC testing technologies.

History Categories of application Mass production products Convertible testing platforms Existing testing platforms

Existing testing platforms

  Memory Logic/Mixed-Signal CIS/CCD LCD Driver RF/Wireless SOC
Advantest

T5571P / T5581H / T5585

T5588 / T5371 / T5372 /

T5377S / T5382A / T5771

T5335 / T5365 / T5334 /

T5335P

T6672 / T6673

T6575 / T6577 

T6683

 

T6331 / T6371

T6372 / T6373

T2000-RF T2000

Agilent

(Verigy)

V1200 / V2000

V3000 / V4400

HP93K / HP94K / HP 83K HP93KIP / 94KIP   HP93KPSRF HP93KPS / PS1600
LTX-Credence

Kalos / XW

Kalos ll / HEX

Pkalos / Pkalos ll

Duo / Quartet

SCX12 / ITS9KEXA / CV

ITS3KEXA / ASL1K / ASL3K-MS

Sapphire / D10

   

ASL3K-RF

Fusion-CX

Fusion-MX

Sapphire / D10

Fusion-MX

DiamondX

Teradyne M1/ M2

Catalyst / J750

J750EX / iFlex

Ultra Flex

IP750 / IP750EMP

 

Flex-RF

Catalyst-RF

Ultra Flex-RF

J750EX / J750 / J750HD /

ETS-364

iFlex / Utra Flex

Catalyst / M1 / M2

Yokogawa      

TS6700 / ST6730

   
KYEC M-series tester E-series tester I-series tester D-series tester E-series tester E-series tester

 

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